For more information about our PROXIMA
For more information about our products.
PROXIMA’s design allows you to perform pure tensile/compression tests, as well as 3 and/or 4 point bending tests and biaxial tests up to 3kN.
Each test can be performed during EBSD analysis, achieving very low sample-
Diffracted cone for tensile/compression sample
Diffracted cone for 3-
Diffracted cone for biaxial sample
Smaller WD (working distance)
A shorter WD creates a pattern center near the top of the phosphor screen so that the diffraction intensity is uniform and the Kikuchi lines are in focus. The upper structure of PROXIMA has been optimized to reduce the working distance between the pole piece of the scanning electron microscope and the testing sample.
Unlike conventional designs, the 70° tilt is not performed on the entire machine, but is limited on the clamping sample. This educes any premature collisions between PROXIMA and the pole piece of the SEM, thus achieving WDs of 12mm.
Smaller SSD (screen-
The quality of the recorded patterns depend on the sample-
Unlike traditional testing devices with two columns on each side of the testing sample, the new PROXIMA relocates this mechanism behind the testing sample. Reducing the number of ball screws allows to open an area on one side of the sample. As a result, the phosphor screen of the EBSD detector can achieve SSD of 12mm.
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