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Home > Testing Devices > Sirius > Introduction

Biaxial testing is more representative when it comes to simulating stresses which we encounter in our daily life. Therefore the importance of this kind of testing has an increasing role in material characterization and modelling. However, today’s biaxial testing devices occupy a lot of space and in situ testing in constrained environments are unthinkable.

Over the last few years, our engineers were able to develop a technology which allows to down-size considerably these machines. Confined spaces, as scanning electron microscopes, are now in our reach. Local analysis of phases, crystallographic orientation, deformation and stresses can be evaluated during an in situ test.

This new technology is able to measure both force and displacement in the X and Y axis. Both axis can be controlled separately and simultaneously, which allows to simulate complex loading (tensile, compression and low-cycle fatigue). While specimens are generally cruciform, this machine can develop forces up to 3.000 N.

Do not hesitate to contact us if you are interested in this technology.

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MicroMecha SIRIUS - For biaxial samples