microMECHA PROXIMA is a tensile, compression, and bending stage (3- or 4-point), designed for in situ mechanical testing within a scanning electron microscope (SEM), under a diffraction goniometer, Raman spectroscope, or optical microscope.

Its optimized design enables simultaneous use of complementary analysis techniques such as EBSD, EDS, and WDS. High system stiffness ensures precise displacement control and axial force application aligned with the specimen axis.

Force and displacement are directly measured through integrated clamping systems. For EBSD applications, the stage allows rapid switching between 0° and 70° tilt positions via indexed positioning pins.

Operation Mode: Tensile and Compression
Weight: 1,5 kg
Dimension (LxWxH): 189 x 86 x 53 mm
Total Stroke: 15 mm for 50 mm long specimen
Maximum Force: 3 kN in tensile and compression
Force Sensor: Precision ±0.25 % of full scale
Displacement Sensor: Optical Encoder, Resolution 0.1 μm
Displacement Speed: 0.1 μm/s to 37 μm/s
Application Field: SEM, LM, AFM
Temperature Range: 5 – 40 °C
Humidity Range: < 10 g/m³